作者: Zhang, Zhenwei1, 2; Zhao, Yuejin1; Miao, Yinxiao3; Zhang, Cunlin2 (1Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China;2Key Laboratory of Terahertz Optoelectronics, Beijing Engineering Research Center of Terahertz and Infrared Technology, Beijing Advanced Innovation Center for Imaging Theory and Technology, Department of Physics, Capital Normal University, Beijing; 100048, China;3Beijing Aerospace Institute for Metrology and Measurement Technology, Beijing; 100076, China)
出处: Guangxue Xuebao/Acta Optica Sinica 2022 Vol.42 No.4
作者: Yue, Kang1; Guo, Mei2; Liu, Yue3; Hu, Haochen4; Lu, Kai4; Chen, Shanshan5; Wang, Danli6 (1Beijing, China, 10010;2School of Optics and Photonics, Beijing Institute of Technology, 47833 Beijing, China, 100081;3School of Optoelectronics, Beijing Institute of Technology, Beijing, Beijing, China;4Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, 47833 Beijing, Beijing, China;5Beijing Institute of Technology, 47833 Beijing, Beijing, China, 100081;6Institute of Automation Chinese Academy of Sciences, 74522 Beijing, Beijing, China, 100190)
出处: IEEE Journal of Biomedical and Health Informatics 2022
作者: Zhong, Hui1; Li, Yanqiu1; Qin, Peng1; He, Fei1; Liu, Ke1 (1Key Laboratory of Photoelectronic Imaging Technology and System of Ministry of Education of China, School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China)
出处: Optics and Lasers in Engineering 2022
作者: Zuo, Yi-Fan1; Yang, Jiaqi2; Chen, Jiaben2; Wang, Xia1; Wang, Yifu2; Kneip, Laurent2, 3 (1Key Laboratory of Optoelectronic Imaging Technology and Systems, Ministry of Education, School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China;2Mobile Perception Lab, ShanghaiTech University, China;3The Shanghai Engineering Research Center of Intelligent Vision and Imaging, China)
出处: arXiv 2022
作者: Matsudo, Bernhard Reineke1; Sain, Basudeb1; Carletti, Luca2; Zhang, Xue3; Gao, Wenlong1; de Angelis, Costantino2; Huang, Lingling3; Zentgraf, Thomas1 (1Department of Physics, Paderborn University, Warburger Straße 100, Paderborn; 33098, Germany;2Department of Information Engineering, National Institute of Optics (CNR-INO), University of Brescia, Brescia; 25123, Italy;3School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China)
出处: arXiv 2022
作者: Chen, Chaoyong1, 2; Gao, Chunqing1, 2; Dai, Huixing1, 2; Wang, Qing1, 2 (1School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China;2Key Laboratory of Information Technology, Ministry of Industry and Information Technology, Beijing; 100081, China)
出处: Chinese Optics Letters 2022 Vol.20 No.4
作者: Frese, Daniel1; Sain, Basudeb1; Zhou, Hongqiang2; Wang, Yongtian2; Huang, Lingling2; Zentgraf, Thomas1 (1Department of Physics, Paderborn University, Warburger Straße 100, Paderborn; 33098, Germany;2School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China)
出处: arXiv 2022
作者: Tian, Yongqi1, 3; Gong, Xueyuan2; Tang, Jialin3; Su, Binghua1, 3; Liu, Xiaoxiang2; Zhang, Xinyuan2 (1School of Optoelectronics, Beijing Institute of Technology, Beijing, China;2School of Intelligent Systems Science and Engineering, Jinan University, Zhuhai, China;3School of Information Technology, Beijing Institute of Technology, Zhuhai, China)
出处: arXiv 2022
作者: Yang, Delong1; Zhang, Shaohui1; Zheng, Chuanjian1; Zhou, GuoCheng1; Cao, Lei1; Hu, Yao1; Hao, Qun1 (1School of Optics and Photonics, Beijing Institute of Technology, Beijing, China)
出处: arXiv 2022
作者: Jiao, Qing-Liang1; Liu, Ming1; Yu, Kun2; Liu, Zi-Long2, 3; Kong, Ling-Qin1; Hui, Mei1; Dong, Li-Quan1; Zhao, Yue-Jin1 (1Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China;2Henan Key Laboratory of Infrared Materials and Spectrum Measures and Applications, School of Physics, Henan Normal University, Xinxiang; 453007, China;3Institute of Optics & Laser Metrology, National Institute of Metrology, Beijing; 100013, China)
出处: Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis 2022 Vol.42 No.1 P292-297