作者: Li, Fen1; Zhao, Yuejin1; Kong, Lingqin1; Liu, Ming1; Dong, Liquan1; Hui, Mei1; Liu, Xiaohua1 (1Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China)
出处: Guangxue Xuebao/Acta Optica Sinica 2020 Vol.40 No.6
作者: Kong, Lingqin1; Wu, Yuheng1; Zhao, Yuejin1; Dong, Liquan1; Liu, Ming1; Hui, Mei1 (1Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China)
出处: Guangxue Xuebao/Acta Optica Sinica 2020 Vol.40 No.13
作者: Liu, Bingyi1, 2; Sain, Basudeb2; Reineke, Bernhard2; Zhao, Ruizhe3; Meier, Cedrik2; Huang, Lingling3; Jiang, Yongyuan1, 4, 5, 6; Zentgraf, Thomas2 (1School of Physics, Harbin Institute of Technology, Harbin; 150001, China;2Department of Physics, Paderborn University, Warburger Straße 100, Paderborn; D-33098, Germany;3School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China;4Key Lab of Micro-Optics and Photonic Technology of Heilongjiang Province, Harbin; 150001, China;5Key Laboratory of Micro-Nano Optoelectronic Information System, Ministry of Industry and Information Technology, Harbin; 150001, China;6Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan; 030006, China)
出处: arXiv 2020
作者: Ning, Jianglan1; Xu, Zhilong1; Wu, Dan2; Zhang, Rui1; Wang, Yuanyuan1; Xie, Yingge1; Zhao, Wei3; Ma, Xu4; Ren, Wenyi1 (1School of Science, Northwest A&F University, Yangling, Shaanxi; 712100, China;2College of Mechanical and Electronic Engineering, Northwest A&F University, Yangling, Shaanxi; 712100, China;3Shaanxi Public Security Judicial Authentication Center, Shaanxi Public Security Department, Xian; Shaanxi; 710016, China;4Key Laboratory of Photoelectronic Imaging Technology and System of Ministry of Education of China, School of Optoelectronics, Beijing Institute of Technology, Beijing; 100081, China)
出处: arXiv 2020
作者: Xing, Yangguang1, 2, 3; Li, Lin1; Peng, Jilong2; Wang, Shanshan1; Cheng, Yinuo4 (1School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China;2Beijing Institute of Spacecraft Environment Engineering, Beijing; 100094, China;3National Key Laboratory of Science and Technology on Reliability and Environment Engineering, Beijing; 100094, China;4Department of Precision Instrument, Tsinghua University, Beijing; 100091, China)
出处: Guangxue Xuebao/Acta Optica Sinica 2020 Vol.40 No.23
作者: Feng, Shijia1; Dong, Liquan1; Ma, Danni1; Wu, Tong1; Zhang, Liangliang2; Zhao, Yuejin1 (1Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China;2Beijing Advanced Innovation Center for Imaging Technology, Department of Physics, Capital Normal University, Beijing; 100048, China)
出处: Guangxue Xuebao/Acta Optica Sinica 2020 Vol.40 No.10
作者: Liu, Xin1; Chang, Jun1; Chen, Weilin1; Du, Shan1; Wu, Chuhan1; Xu, Xiangxin1; Zhu, Yi2 (1Key Laboratory of Photoelectronic Imaging Technology and System of Ministry of Education of China, School of Optics and Photonics, Beijing Institute of Technology, Beijing; 100081, China;2China Ordnance Industrial Standardization Research Institute, Beijing; 100089, China)
出处: Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering 2020 Vol.49 No.8
作者: Zhao, Man1; Guo, Yi-Xin1; He, Yu-Qing1; Guo, Hong1; Jin, Wei-Qi1; Ren, Lin-Mao1, 2 (1MOE Key Laboratory of Optoelectronic Imaging Technology and System, School of Optoelectronics, Beijing Institute of Technology, Beijing; 100081, China;2Railway Police College, Zhengzhou; 450053, China)
出处: Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis 2020 Vol.40 No.6 P1862-1868
作者: Liu, Xin1; Chang, Jun1; Zhong, Yue1; Feng, Shuai1; Song, Dalin1, 2; Hu, Yaoyao1 (1School of Optics and Photonics, Beijing Institute of Technology, Beijing, China;2The First Research Institute of the Ministry of Public Security, Beijing, China)
出处: Journal of Modern Optics 2020 Vol.67 No.5 P462-468
作者: Liu, Jing1; Shen, Jing-Ling2; Zhang, Cun-Lin1, 2; Zhao, Yue-Jin1 (1School of Optoelectronics, Beijing Institute of Technology, Beijing; 100081, China;2Key Laboratory of Terahertz Optoelectronics, Ministry of Education, Capital Normal University, Beijing; 100048, China)
出处: Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves 2020 Vol.39 No.4 P430-433